Webinar: Parametric Test Basic Training
This Webcast will cover the basics of parametric test. This includes topics such as shielding and guarding, coaxial versus triaxial cables, SMU fundamentals, Kelvin measurement, low-current measurem...
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Agilent's product showcase news for August 2010
This news is extracted from our partner Agilent Technologies...
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Press Release: Agilents' Infiniium 90000 X-Series Oscilloscope Wins Electron d'Or 2010 Award
Agilent Technologies Inc. which is locally sold and supported by Concilium Technologies recently announced that the Infiniium 90000 X-Series oscilloscope has been selected as the winner of the prestig...
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Press Release: (Formally Agilent) JDSU Wins Award for Best LTE Test Product at 2010 LTE World Summit
Milpitas, Calif., June, 2010 – JDSU (NASDAQ: JDSU and TSX: JDU) today announced that an impartial panel of wireless industry experts judged the JDSU LTE Network Trial Solution to be the Best Testing P...
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Agilent's product showcase news for June 2010
This news is extracted from our partner Agilent Technologies....
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Press Release: Agilent Extends Leadership in LTE Test Capability with PXA Signal Analyser
Agilent Technologies Inc. recently announced an LTE test solution that combines the market‑leading Agilent 89600 VSA LTE FDD and LTE TDD analysis software with the highest‑performance mem...
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